Floating-island TFT leakage caused by process step reduction
- Takatoshi Tsujimura
- Osamu Tokuhiro
- et al.
- 2002
- IEEE Transactions on Electron Devices
Publications
139 results at IEEE Transactions on Electron Devices
Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces
- Kangguo Cheng
- Jinju Lee
- et al.
- 2002
- IEEE Transactions on Electron Devices
Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs
- Yuan Taur
- 2001
- IEEE Transactions on Electron Devices
High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements
- Franco Stellari
- Franco Zappa
- et al.
- 2001
- IEEE Transactions on Electron Devices
History and future perspective of the modern silicon bipolar transistor
- T.H. Ning
- 2001
- IEEE Transactions on Electron Devices
Group IVB metal oxides high permittivity gate insulators deposited from anhydrous metal nitrates
- Tiezhong Ma
- Stephen A. Campbell
- et al.
- 2001
- IEEE Transactions on Electron Devices
Improved low temperature characteristics of p-channel MOSFETs with Si 1-xGe x raised source and drain
- Hsiang-Jen Huang
- Kun-Ming Chen
- et al.
- 2001
- IEEE Transactions on Electron Devices
High-performance bottom electrode organic thin-film transistors
- Ioannis Kymissis
- C. Dimitrakopoulos
- et al.
- 2001
- IEEE Transactions on Electron Devices
Mosfet channel length: extraction and interpretation
- Yuan Taur
- 2000
- IEEE Transactions on Electron Devices
A novel Si/SiGe heterojunction pMOSFET with reduced short-channel effects and enhanced drive current
- Qiqing Ouyang
- Xiangdong Chen
- et al.
- 2000
- IEEE Transactions on Electron Devices