Investigation of kink-induced excess RF channel noise in sub -50 nm PD-SOI MOSFETs
- Ninad S. Wadje
- Vijaya Bhaskara Neeli
- et al.
- 2010
- IEEE International SOI Conference 2010
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.