X 2 e: A general quantitative approach to the calculation of (e, 2 e) and related processes
- Colm T. Whelan
- R.K. Nesbet
- et al.
- 2007
- Journal of Electron Spectroscopy and Related Phenomena
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67 results at Journal of Electron Spectroscopy and Related Phenomena
Correction of non-linearity effects in detectors for electron spectroscopy
- N. Mannella
- S. Marchesini
- et al.
- 2004
- Journal of Electron Spectroscopy and Related Phenomena
Determination of rotational polarization using 1 + 1′ REMPI: A case study of D2 associative desorption from Cu(111)
- H. Hou
- S.J. Gulding
- et al.
- 1999
- Journal of Electron Spectroscopy and Related Phenomena
Liquid crystal alignment by rubbed polymer surfaces: A microscopic bond orientation model
- J. Stöhr
- M.G. Samant
- 1999
- Journal of Electron Spectroscopy and Related Phenomena
Conductance through atomic contacts created by scanning tunneling microscopy
- C. Kilic
- H. Mehrez
- et al.
- 1999
- Journal of Electron Spectroscopy and Related Phenomena
Soft X-ray microscope with zone plate at UVSOR
- Norio Watanabe
- S. Aoki
- et al.
- 1996
- Journal of Electron Spectroscopy and Related Phenomena
Resonant inelastic scattering in localized solid systems by soft X-ray fluorescence spectroscopy
- R.C.C. Perera
- J.J. Jia
- et al.
- 1996
- Journal of Electron Spectroscopy and Related Phenomena
Stoichiometry reversal and depth-profiling in the growth of thin oxynitride films with N2O on Si(100) surfaces
- D.G.J. Sutherland
- H. Akatsu
- et al.
- 1996
- Journal of Electron Spectroscopy and Related Phenomena
Spectroscopic manifestation of mass renormalization in a layered 4d-electron superconductor Sr2RuO4
- I.H. Inoue
- Y. Aiura
- et al.
- 1996
- Journal of Electron Spectroscopy and Related Phenomena
Photoelectron holography: improvements to atom image recovery from experimental data
- L.J. Terminello
- B.L. Petersen
- et al.
- 1995
- Journal of Electron Spectroscopy and Related Phenomena