Gerard V. Kopcsay, Byron Krauter, et al.
IEEE Transactions on VLSI Systems
Dielectric constant εr and broadband dielectric loss tan δ measurements were performed for the thermoplastic toughened cyanate ester printed circuit board CYTUF™ material. Characterization of tan δ over the 1-8 GHz frequency range was made using a simple short-pulse propagation technique. All the measurements were taken on four-metal-layer, 23 × 36 cm cards with representative transmission line structures. It was found the εr = 3.48 - 3.64 and tan δ = 0.0095 - 0.01, which are much lower than for standard FR-4 material. The impact of improved characteristics on wireability is analyzed through simulations of representative printed circuit board interconnections. © 1996 IEEE.
Gerard V. Kopcsay, Byron Krauter, et al.
IEEE Transactions on VLSI Systems
Haikun Zhu, Chung-Kuan Cheng, et al.
IEEE Topical Meeting EPEPS 2007
Alina Deutsch, Roger S. Krabbenhoft, et al.
IEEE Trans Electromagn Compat
Vincent A. Ranieri, Alina Deutsch, et al.
IEEE Trans. Instrum. Meas.