Robert F. Cook, Eric G. Liniger, et al.
JACerS
It has been demonstrated that, in those instances where electromigration-induced mass transport is dominated by interfacial diffusion, the adhesion at the interface where mass transport is primarily taking place is related to the electromigration flux. Furthermore, it is shown that the cohesive energy of the interface is directly related to the activation energy for diffusion. © 2005 IEEE.
Robert F. Cook, Eric G. Liniger, et al.
JACerS
James Kelly, James H.-C. Chen, et al.
IITC/AMC 2016
Deepika Priyadarshini, Son Nguyen, et al.
IITC/AMC 2014
H. Huang, Krystelle Lionti, et al.
IITC/AMC 2016