Moisture-induced interfacial oxidation of chromium on polyimide
B.K. Furman, H.M. Clearfield, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
This paper describes a unique, highly flexible and cost competitive method to fabricate microelectronic packages that require thin film interconnections. The method involves fabricating thin film metal/polymer structures multi-up on a reusable temporary glass carrier and later transferring the thin film stack onto product substrates of choice. The final product substrate can be silicon, co-fired alumina or glass-ceramic, aluminum nitride, diamond or a printed wiring board. Op-tionally, one can also use the released thin film decal as a flexible high wireability interconnect by itself, as an interposer, or in applications like wafer level testing for known good die (KGD). The thin film wiring structure can be fabricated multi-up on a standardized form factor carrier (independent of the characteristics of the final product substrate) in a thin film interconnect foundry, thus significantly reducing cost both from the economy of scales and ftiU utilization of the thin film factory for a variety of customer needs.
B.K. Furman, H.M. Clearfield, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
R.S. Rai, S.K. Kang, et al.
ECTC 1995
A.C. Callegan, K. Babich, et al.
Microelectronic Engineering
E.G. Colgan, F.E. Doany, et al.
Journal of the Society for Information Display