Corey Liam Lammie, Julian Büchel, et al.
ISCAS 2025
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Corey Liam Lammie, Julian Büchel, et al.
ISCAS 2025
Elena Ferro, A. Vasilopoulos, et al.
ISCAS 2024
Victor Chan, Ken Rim, et al.
CICC 2005
Hussein Hamieh, Juliano Borges, et al.
ECTC 2023