Brian Vanderpool, Phillip Restle, et al.
ISSCC 2022
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Brian Vanderpool, Phillip Restle, et al.
ISSCC 2022
Hadjer Benmeziane, Imane Hamzaoui, et al.
IJCAI 2024
Alper Buyuktosunoglu
ISCA 2025
Roman Pletka, Dionysios Diamantopoulos, et al.
FMS 2023