Yousef El-Kurdi, Jerry Quinn, et al.
EMNLP 2022
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed.
Yousef El-Kurdi, Jerry Quinn, et al.
EMNLP 2022
Sathya Raghavan, Hiroyuki Mori, et al.
ECTC 2023
Revanth Kodoru, Atanu Saha, et al.
arXiv
Frank R. Libsch, Hiroyuki Mori
ECTC 2023