Conducting Transition Metal Oxides: Possibilities for RuO2in VLSI Metallization
- L. Krusin-Elbaum
- M. Wittmer
- 2019
- JES
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46 results for M. Wittmer
Dopant Diffusion in Self-Aligned Silicide/Silicon Structures
- Marc Wittmer
- 2019
- JES
Interface Properties of Hydrogenated Amorphous Carbon Films on Ge(100) Surfaces
- M. Wittmer
- D. Ugolini
- et al.
- 2019
- JES
EFFECT OF Cu ON THE KINETICS AND MICROSTRUCTURE OF Al3Ti FORMATION.
- M. Wittmer
- F. Le Goues
- et al.
- 2019
- JES
Interaction Between ti and SiO2
- C.-Y. Ting
- M. Wittmer
- et al.
- 2019
- JES
The Microstructure of Transition Metal/Al(Cu) Layers
- H.-C.W. Huang
- M. Wittmer
- et al.
- 2019
- JES
Solute effect of arsenic on the microstructure and diffusion mechanism in platinum-silicides
- M. Wittmer
- J.T. Wetzel
- et al.
- 2006
- Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
Schottky barriers and the reactivity of the interface
- M. Wittmer
- J. Freeouf
- 1994
- EPL
Lifetime measurements on silicon-on-insulator wafers
- J. Freeouf
- N. Braslau
- et al.
- 1993
- Applied Physics Letters
Wittmer et al. reply
- M. Wittmer
- P. Fahey
- et al.
- 1993
- Physical Review Letters