Surface morphology and alloy ordering in epitaxial growth of SiGe
- F.K. LeGoues
- J. Tersoff
- et al.
- 1993
- Physical Review Letters
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111 results for F.K. LeGoues
Observation of buried interfaces with low energy electron microscopy
- R.M. Tromp
- A.W. Denier Van Der Gon
- et al.
- 1993
- Physical Review Letters
Measurement of the activation barrier to nucleation of dislocations in thin films
- F.K. LeGoues
- P.M. Mooney
- et al.
- 1993
- Physical Review Letters
Defect self-annihilation in surfactant-mediated epitaxial growth
- M. Horn-Von Hoegen
- F. Legoues
- et al.
- 1991
- Physical Review Letters
Anomalous strain relaxation in SiGe thin films and superlattices
- F. Legoues
- B.S. Meyerson
- et al.
- 1991
- Physical Review Letters
Surface-stress-induced order in SiGe alloy films
- F. Legoues
- V.P. Kesan
- et al.
- 1990
- Physical Review Letters
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
- J. Freeouf
- J.C. Tsang
- et al.
- 1990
- Physical Review Letters
Long-range order in thick, unstrained Si0.5Ge0.5 epitaxial layers
- F.K. LeGoues
- V.P. Kesan
- et al.
- 1990
- Physical Review Letters
Novel strain-induced defect in thin molecular-beam epitaxy layers
- F. Legoues
- M. Copel
- et al.
- 1989
- Physical Review Letters
Orientation dependence of grain-boundary critical currents in YBa2Cu3O7- bicrystals
- D. Dimos
- P. Chaudhari
- et al.
- 1988
- Physical Review Letters