Impact of attenuated mask topography on lithographic performance
- Richard A. Ferguson
- William J. Adair
- et al.
- 1994
- Microlithography 1994
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20 results for D.C. La Tulipe
0.25-μm lithography development using positive mode top surface imaging photoresist
- Douglas C. La Tulipe
- John P. Simons
- et al.
- 1994
- Microlithography 1994
Wafer-level 3D integration technology
- Steven J. Koester
- Albert M. Young
- et al.
- 2008
- IBM J. Res. Dev
Three-dimensional integrated circuits
- Anna W. Topol
- Douglas C. La Tulipe Jr.
- et al.
- 2006
- IBM J. Res. Dev
Low energy electron beam top surface image processing using chemically amplified AXT resist
- C.S. Whelan
- D.M. Tanenbaum
- et al.
- 1997
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Thin-film imaging: Past, present, prognosis
- David Seeger
- D.C. La Tulipe Jr.
- et al.
- 1997
- IBM J. Res. Dev
Positive mode silylation process characterization
- D.C. La Tulipe
- A.T.S. Pomerene
- et al.
- 1992
- Microelectronic Engineering
Thermally stable ohmic contacts to n-type GaAs. VIII. Sputter-deposited InAs contacts
- H.-J. Kim
- Masanori Murakami
- et al.
- 1990
- Journal of Applied Physics
IIA-2 Saturable Charge FET
- P. Solomon
- D.J. Frank
- et al.
- 1987
- IEEE T-ED
Probe pressure effect on tunneling current through a GaAs-(Al,Ga)As-GaAs heterojunction barrier
- P. Solomon
- S.L. Wright
- et al.
- 1986
- Applied Physics Letters