High speed electron beam testing
- George Chiu
- Jean-Marc Halbout
- et al.
- 1989
- Microelectronic Engineering
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22 results for P.G. May
Characterization of an experimental thin-film interconnection structure
- G. Arjavalingam
- P.G. May
- et al.
- 1989
- Proceedings of SPIE 1989
Characterization of logic devices with photoconductively generated picosecond pulses
- J.-M. Halbout
- P.G. May
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Photoelectron scanning electron microscope (PSEM) for high speed noncontact testing
- P.G. May
- J.-M. Halbout
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Capacitance Free Generation and Detection of Subpicosecond Electrical Pulses on Coplanar Transmission Lines
- Naomi J. Halas
- Mark B. Ketchen
- et al.
- 1988
- IEEE JQE
Noncontact High-Speed Waveform Measurements with the Picosecond Photoelectron Scanning Electron Microscope
- Paul G. May
- Jean-Marc Halbout
- et al.
- 1988
- IEEE JQE
Noncontact Internal Waveform Measurements with Picosecond Time Resolution on a 0.5-/xm CMOS SRAM
- Yvon Pastol
- Jean-Marc Halbout
- et al.
- 1988
- IEEE Electron Device Letters
Waveform Measurements in High-Speed Silicon Bipolar Circuits Using a Picosecond Photoelectron Scanning Electron Microscope
- Paul May
- Jean-Marc Halbout
- et al.
- 1988
- IEEE T-ED
Ultrashort electron-pulse probing of integrated circuits
- Jean-Marc Halbout
- Paul May
- et al.
- 1988
- Journal of Modern Optics
High speed device testing and internal node diagnostics
- George Chiu
- Jean-Marc Halbout
- et al.
- 1987
- Microlithography 1987