Roughness analysis of Si1-xGex films
- R.M. Feenstra
- M.A. Lutz
- et al.
- 1994
- MRS Fall Meeting 1994
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12 results for M.A. Lutz
Surface diffusion and phase transition on the Ge(111) surface studied by scanning tunneling microscopy
- R.M. Feenstra
- A.J. Slavin
- et al.
- 1991
- Physical Review Letters
Unique x-ray diffraction pattern at grazing incidence from misfit dislocations in SiGe thin films
- J.L. Jordan-Sweet
- P.M. Mooney
- et al.
- 1996
- Journal of Applied Physics
Roughness analysis of Si/SiGe heterostructures
- R.M. Feenstra
- M.A. Lutz
- et al.
- 1995
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Scanning tunneling microscopy of in situ cleaved and hydrogen passivated Si(110) cross-sectional surfaces
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1995
- Surface Science
Low-temperature grown III-V materials
- M.R. Melloch
- J. Woodall
- et al.
- 1995
- Annual Review of Materials Science
Influence of misfit dislocations on the surface morphology of Si1-xGex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1995
- Applied Physics Letters
Scattering from strain variations in high-mobility Si/SiGe heterostructures
- R.M. Feenstra
- M.A. Lutz
- 1995
- Journal of Applied Physics
Facet formation in strained Si1-x Gex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1994
- Surface Science
Edge melting of the Ge(111) surface studied by scanning tunneling microscopy
- R.M. Feenstra
- A.J. Slavin
- et al.
- 1992
- Ultramicroscopy