In situ study of void growth kinetics in electroplated Cu lines
- E. Liniger
- L. Gignac
- et al.
- 2002
- Journal of Applied Physics
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129 results for Eric G. Liniger
Electromigration in on-chip single/dual damascene Cu interconnections
- C.-K. Hu
- L. Gignac
- et al.
- 2002
- JES
Evaluation of the modified edge lift-off test for adhesion characterization in microelectronic multifilm applications
- Jack C. Hay
- Eric G. Liniger
- et al.
- 2001
- Journal of Materials Research
Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics
- I.C. Noyan
- P.-C. Wang
- et al.
- 2000
- Review of Scientific Instruments
The effect of stress on the dielectric properties of barium strontium titanate thin films
- T.M. Shaw
- Z. Suo
- et al.
- 1999
- Applied Physics Letters
Stress-Corrosion Cracking of Low-Dielectric-Constant Spin-On-Glass Thin Films
- Robert F. Cook
- Eric G. Liniger
- 1999
- JES
Characterization of substrate/thin-film interfaces with x-ray microdiffraction
- I.C. Noyan
- J.L. Jordan-Sweet
- et al.
- 1998
- Applied Physics Letters
Polymeric organic-inorganic hybrid nanocomposites: Preparation of polyimide-modified poly(silsesquioxane) using functionalized poly(amic acid alkyl ester) precursors
- J.L. Hedrick
- H.J. Cha
- et al.
- 1997
- Macromolecules
Nanoscopically engineered organic-inorganic hybrids as low dielectric constant, high modulus insulating materials for microelectronic applications
- J.L. Hedrick
- R.D. Miller
- et al.
- 1997
- American Chemical Society, Polymer Preprints, Division of Polymer Chemistry
Indentation fracture of polycrystalline cubic ceramics
- R.F. Cook
- E. Liniger
- et al.
- 1994
- Journal of hard materials