A statistical critical path monitor in 14nm CMOS
- Bruce Fleischer
- Christos Vezyrtzis
- et al.
- 2016
- ICCD 2016
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236 results for Keith A. Jenkins
Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved Emission
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2016
- IEEE T-ED
Reduction of Hot Carrier Degradation of FinFETs Due to Short-Pulse Stress
- Keith A. Jenkins
- Barry P. Linder
- 2015
- IEEE Electron Device Letters
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology
- Tony Tae-Hyoung Kim
- Pong-Fei Lu
- et al.
- 2015
- IEEE Transactions on VLSI Systems
Performance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillator
- Chih-Hsiang Ho
- Keith A. Jenkins
- et al.
- 2015
- IEEE T-ED
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
The 12-core POWER8™ processor with 7.6 Tb/s IO bandwidth, integrated voltage regulation, and resonant clocking
- Eric J. Fluhr
- Steve Baumgartner
- et al.
- 2015
- IEEE JSSC
Virtual de-embedding study for the accurate extraction of Fin FET gate resistance
- Shireen Warnock
- Rob Groves
- et al.
- 2014
- CICC 2014
Long-term NBTI degradation under real-use conditions in IBM microprocessors
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2014
- Microelectronics Reliability