A robust reliability methodology for accurately predicting Bias Temperature Instability induced circuit performance degradation in HKMG CMOS
- D.P. Ioannou
- K. Zhao
- et al.
- 2011
- IRPS 2011
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46 results for Jae-Joon Kim
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Bias Temperature Instability model for digital circuits - Predicting instantaneous FET response
- Aditya Bansal
- Kai Zhao
- et al.
- 2011
- IRPS 2011
Technology-circuit co-design of asymmetric SRAM cells for read stability improvement
- Jae-Joon Kim
- Rahul Rao
- et al.
- 2010
- CICC 2010
Impact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- IRPS 2009
Statistical yield analysis of silicon-on-insulator embedded DRAM
- R. Kanj
- R.V. Joshi
- et al.
- 2009
- ISQED 2009
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
- Jae-Joon Kim
- Rahul Rao
- et al.
- 2008
- ICICDT 2008
Capacitive coupling based transient negative bit-line voltage (tran-NBL) scheme for improving write-ability of SRAM design in nanometer technologies
- S. Mukhopadhyay
- R.M. Rao
- et al.
- 2008
- ISCAS 2008
Design and analysis of a self-repairing SRAM with on-chip monitor and compensation circuitry
- Niladri Narayan Mojumder
- Saibal Mukhopadhyay
- et al.
- 2008
- VTS 2008
On-chip process variation detection using slew-rate monitoring circuit
- Amlan Ghosh
- Rahul M. Rao
- et al.
- 2008
- VLSID 2008