Current challenges in Ge MOS technology
- A. Dimoulas
- M. Houssa
- et al.
- 2006
- ECS Meeting 2006
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92 results for J.P. Locquet
High-K dielectrics for the gate stack
- Jean-Pierre Locquet
- Chiara Marchiori
- et al.
- 2006
- Journal of Applied Physics
Field-effect transistors with SrHfQ3 as gate oxide
- C. Rossel
- B. Mereu
- et al.
- 2006
- Applied Physics Letters
Evidence of electron and hole inversion in GaAs metal-oxide-semiconductor capacitors with HfO 2 gate dielectrics and α-Si/SiO 2 interlayers
- S.J. Koester
- E.W. Kiewra
- et al.
- 2006
- Applied Physics Letters
Structural domains in antiferromagnetic LaFeO3 thin films
- Jin Won Seo
- Christel Dieker
- et al.
- 2006
- Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques
Structural domains in antiferromagnetic LaFeO3thin films
- Jin Won Seo
- Christel Dieker
- et al.
- 2006
- Journal of Materials Research
Electrostatic modulation of the superfluid density in an ultrathin La2-xSrxCuO4 film
- A. Rüfenacht
- J.P. Locquet
- et al.
- 2006
- Physical Review Letters
Solid phase epitaxy of SrTi O3 on (Ba,Sr) OSi (100): The relationship between oxygen stoichiometry and interface stability
- G.J. Norga
- C. Marchiori
- et al.
- 2006
- Journal of Applied Physics
Control of interfacial structure and electrical properties in MBE grown single crystalline SrTiO3 gate dielectrics on Si(100)
- Gerd Norga
- Chiara Marchiori
- et al.
- 2006
- MRS Spring Meeting 2006
Thermal stability of the SrTi O3 (Ba,Sr) O stacks epitaxially grown on Si
- Chiara Marchiori
- M. Sousa
- et al.
- 2006
- Applied Physics Letters