M. Hopstaken, D. Pfeiffer, et al.
Surface and Interface Analysis
By capacitively charging an underdoped ultrathin La2-xSrxCuO4 film with an electric field applied across a gate insulator with a high dielectric constant, relative changes of the areal superfluid density ns□ of unprecedented strength were observed in measurements of the film kinetic inductance. Although ns□ appears to be substantially reduced by disorder, the data provide, for the first time on the same sample, direct compelling evidence for the Uemura relation Tcns□(T=0) in the underdoped regime of copper-oxide superconductors. © 2006 The American Physical Society.
M. Hopstaken, D. Pfeiffer, et al.
Surface and Interface Analysis
J. Lüning, F. Nolting, et al.
Physical Review B - CMMP
L. Czornomaz, M. El Kazzi, et al.
Solid-State Electronics
A. Dimoulas, M. Houssa, et al.
ECS Meeting 2006