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182 results for Eduard Cartier

Systematic study of pFET V_t with Hf-based gate stacks with poly-Si and FUSI gates
- - E. Cartier
  - V. Narayanan
  - et al.
- 2004
- VLSI Technology 2004
Surface potential and morphology issues of annealed (HfO ₂) _x(SiO ₂) _1-x gate oxides
- - R. Ludeke
  - P. Lysaght
  - et al.
- 2004
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Dual work function metal gate CMOS using CVD metal electrodes
- - V. Narayanan
  - A.C. Callegari
  - et al.
- 2004
- VLSI Technology 2004
Impact of band structure on charge trapping in thin SiO ₂/Al ₂O ₃/poly-Si gate stacks
- - L. Pantisano
  - L. Lucci
  - et al.
- 2004
- IEEE Electron Device Letters
Charge trapping in SiO₂/HfO₂ gate dielectrics: Comparison between charge-pumping and pulsed I_D-V_G
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- INFOS 2003
Transport and exchange of hydrogen isotopes in silicon-device-related stacks
- - C. Krug
  - E. Gusev
  - et al.
- 2004
- Journal of Applied Physics
Inversion channel mobility in high-κ high performance MOSFETs
- - Z. Ren
  - M.V. Fischetti
  - et al.
- 2003
- IEDM 2003
Stress induced charge trapping effects in SiO₂/Al ₂O₃ gate stacks with TiN electrodes
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- Journal of Applied Physics
Direct Measurement of the Inversion Charge in MOSFETs: Application to Mobility Extraction in Alternative Gate Dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- VLSI Technology 2003
On the thermal stability of atomic layer deposited TiN as gate electrode in MOS devices
- - J. Westlinder
  - T. Schram
  - et al.
- 2003
- IEEE Electron Device Letters