High speed serializing/de-serializing design-for-test method for evaluating a 1 GHz microprocessor
- D. Heidel
- S. Dhong
- et al.
- 1998
- VTS 1998
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55 results for David F. Heidel
1.0-GHz single-issue 64-bit PowerPC integer processor
- Joel Silberman
- Naoaki Aoki
- et al.
- 1998
- IEEE Journal of Solid-State Circuits
Design and implementation of high performance dynamic 64-bit parallel adder with enhanced testability
- W. Hwang
- G.D. Gristede
- et al.
- 1998
- CICC 1998
Submicron CMOS Gate Electrode Discontinuity: Electrical Signature and Effect on Circuit Speed
- Keith A. Jenkins
- J.N. Burghartz
- et al.
- 1993
- IEDM 1993
Ion Microbeam Radiation System
- D. Heidel
- U. Bapst
- et al.
- 1993
- IEEE TNS
A 5Gb/s 16×16 Si-bipolar crosspoint switch
- Hyun Shin
- James Warnock
- et al.
- 1992
- ISSCC 1992
Electron beam tester measurements of switching noise in VLSI circuits
- Keith A. Jenkins
- David F. Heidel
- 1991
- Microelectronic Engineering
Ion Microbeam Probing of Sense Amplifiers to Analyze Single Event Upsets in a CMOS DRAM
- Linda M. Geppert
- David F. Heidel
- et al.
- 1991
- IEEE Journal of Solid-State Circuits
Low temperature 12 ns DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- VLSI-TSA 1989
Low temperature SER and noise in a high speed DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- Workshop on Low Temperature Semiconductor Electronics 1989