Watching chips work: Picosecond hot electron light emission from integrated circuits
- J.A. Kash
- J.C. Tsang
- 2000
- Journal of Crystal Growth
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135 results for James C. Tsang
Time-resolved optical characterization of electrical activity in integrated circuits
- James C. Tsang
- Jeffrey Alan Kash
- et al.
- 2000
- Proceedings of the IEEE
Picosecond imaging circuit analysis
- James C. Tsang
- Jeffrey A. Kash
- et al.
- 2000
- IBM J. Res. Dev
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
- M. McManus
- J.A. Kash
- et al.
- 2000
- Microelectronics Reliability
Chips at Work: Picosecond Imaging Circuit Analysis
- J.A. Kash
- J.C. Tsang
- 1999
- UEO 1999
Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
Backside optical emission diagnostics for excess IDDQ
- J.A. Kash
- J.C. Tsang
- et al.
- 1998
- IEEE Journal of Solid-State Circuits
Dynamic internal testing of CMOS circuits using hot luminescence
- J.A. Kash
- J.C. Tsang
- 1997
- IEEE Electron Device Letters
Temporal characterization of CMOS circuits by time resolved emission microscopy
- J.C. Tsang
- J.A. Kash
- 1997
- DRC 1997
Optical imaging of picosecond switching in CMOS circuits
- J.A. Kash
- J.C. Tsang
- 1997
- CLEO 1997