Influence of misfit dislocations on the surface morphology of Si1-xGex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1995
- Applied Physics Letters
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119 results for P.M. Mooney
Relaxed Si0.7Ge0.3 buffer layers for high-mobility devices
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1995
- Applied Physics Letters
Evolution of strain relaxation in step-graded SiGe/Si structures
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1995
- Applied Physics Letters
Identification of a mobility-limiting scattering mechanism in modulation-doped Si/SiGe heterostructures
- K. Ismail
- F. Legoues
- et al.
- 1994
- Physical Review Letters
Dislocation nucleation barrier in SiGe/Si structures graded to pure Ge
- P.M. Mooney
- F. Legoues
- et al.
- 1994
- Applied Physics Letters
Nucleation of dislocations in SiGe layers grown on (001)Si
- P.M. Mooney
- F.K. LeGoues
- et al.
- 1994
- Journal of Applied Physics
Origin of mosaic structure in relaxed Si1-xGex layers
- P.M. Mooney
- F.K. LeGoues
- et al.
- 1993
- ICDS 1993
Measurements of alloy composition and strain in thin GexSi 1-x layers
- J.C. Tsang
- P.M. Mooney
- et al.
- 1994
- Journal of Applied Physics
High-resolution x-ray diffraction measurements of SiGe/Si structures
- J.L. Jordan-Sweet
- P.M. Mooney
- et al.
- 1994
- MRS Fall Meeting 1994
Facet formation in strained Si1-x Gex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1994
- Surface Science