Artifacts in aberration-corrected ADF-STEM imaging
- Zhiheng Yu
- Philip E. Batson
- et al.
- 2003
- Ultramicroscopy
Publications
Date
Featured collections
Popular topics
89 results for Philip E. Batson
Sub-angstrom probe size in HADF-STEM at 120KV
- Philip Batson
- N. Dellby
- et al.
- 2002
- Microscopy and Microanalysis
Sub-aångstrom resolution using aberration corrected electron optics
- P.E. Batson
- N. Dellby
- et al.
- 2002
- Nature
Effects of detector black level in ADF-STEM imaging
- Zhiheng Yu
- Philip Batson
- et al.
- 2002
- Microscopy and Microanalysis
Structural and electronic characterization of a dissociated dislocation in GeSi
- P.E. Batson
- 2000
- Physical Review B - CMMP
Atomic resolution analytical microscopy
- P.E. Batson
- 2000
- IBM J. Res. Dev
Near-edge conduction band electronic states in SiGe alloys
- Philip E. Batson
- 2000
- Journal of Electron Microscopy
Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface
- P.E. Batson
- 1999
- Physica B: Condensed Matter
Atomic and electronic structure of a dissociated 60° misfit dislocation in GexSi(1-x)
- P.E. Batson
- 1999
- Physical Review Letters
Advanced spatially resolved EELS in the STEM
- P.E. Batson
- 1999
- Ultramicroscopy