Elemental and electronic characterization of semiconductor materials with the STEM
- P.E. Batson
- 1989
- Proceedings of SPIE 1989
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89 results for Philip E. Batson
High resolution spectrometer coupling to the sub-Å IBM STEM
- P.E. Batson
- 2003
- Microscopy and Microanalysis
Experience with the IBM sub-angstrom STEM
- P.E. Batson
- 2003
- Microscopy and Microanalysis
Sub-angstrom probe size in HADF-STEM at 120KV
- Philip Batson
- N. Dellby
- et al.
- 2002
- Microscopy and Microanalysis
Effects of detector black level in ADF-STEM imaging
- Zhiheng Yu
- Philip Batson
- et al.
- 2002
- Microscopy and Microanalysis
Carbon Retention in YBa2Cu3O7−δ its Effect On The Superconducting Transition
- T.M. Shaw
- D. Dimos
- et al.
- 2011
- Journal of Materials Research
Electromagnetic forces on plasmonic nanoparticles induced by fast electron beams
- Alejandro Reyes-Coronado
- Rubén G. Barrera
- et al.
- 2010
- Physical Review B - CMMP
Control of parasitic aberrations in multipole optics
- Philip E. Batson
- 2009
- Journal of Electron Microscopy
Control of shape and material composition of solid-state nanopores
- Meng-Yue Wu
- Ralph M. M. Smeets
- et al.
- 2009
- Nano Letters
Control of parasitic aberrations in multipole corrector optics
- P.E. Batson
- 2008
- Microscopy and Microanalysis