Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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306 results at IEEE Electron Device Letters

A model for gate-oxide breakdown in CMOS inverters
- - R. Rodríguez
  - J.H. Stathis
  - et al.
- 2003
- IEEE Electron Device Letters
Origin of the threshold voltage instability in SiO₂/HfO₂ dual layer gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IEEE Electron Device Letters
Voltage dependence of hard breakdown growth and the reliability implication in thin dielectrics
- - Barry P. Linder
  - Salvatore Lombardo
  - et al.
- 2002
- IEEE Electron Device Letters
1.5-V single work-function W/WN/n⁺-poly gate CMOS device design with 110-nm buried-channel PMOS for 90-nm vertical-cell DRAM
- - Rajesh Rengarajan
  - Boyong He
  - et al.
- 2002
- IEEE Electron Device Letters
Charge trapping in ultrathin hafnium oxide
- - W. Zhu
  - T.P. Ma
  - et al.
- 2002
- IEEE Electron Device Letters
A 4.2-ps ECL ring-oscillator in a 285-GHz f _MAX SiGe technology
- - Basanth Jagannathan
  - Mounir Meghelli
  - et al.
- 2002
- IEEE Electron Device Letters
The impact of gate-oxide breakdown SRAM stability
- - R. Rodríguez
  - J.H. Stathis
  - et al.
- 2002
- IEEE Electron Device Letters
Simultaneous optimization of short-channel effects and junction capacitance in pMOSFET using large-angle-tilt-implantation of nitrogen (LATIN)
- - Kilho Lee
  - Cheruvu Murthy
  - et al.
- 2002
- IEEE Electron Device Letters
A high-speed, high-sensitivity silicon lateral trench photodetector
- - Min Yang
  - Kern Rim
  - et al.
- 2002
- IEEE Electron Device Letters
Measurement of the effect of self-heating in strained-silicon MOSFETs
- - Keith A. Jenkins
  - K. Rim
- 2002
- IEEE Electron Device Letters