Quick turnaround technique for highlighting defects in thin Si/SiGe bilayers
- S.W. Bedell
- D.K. Sadana
- et al.
- 2004
- Electrochemical and Solid-State Letters
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15 results at Electrochemical and Solid-State Letters
Ultrathin 600°C wet thermal silicon dioxide
- J. Appenzeller
- J.A. Del Alamo
- et al.
- 2000
- Electrochemical and Solid-State Letters
Circular pseudo-metal oxide semiconductor field effect transistor in silicon-on-insulator analytical model, simulation, and measurements
- D. Munteanu
- S. Cristoloveanu
- et al.
- 1999
- Electrochemical and Solid-State Letters
Interhalogen Plasma Chemistries for the Etching of NiMnSb
- H. Cho
- K.B. Jung
- et al.
- 1999
- Electrochemical and Solid-State Letters
Nondestructive evaluation of interfaces in bonded silicon-on-insulator structures using the picosecond ultrasonics technique
- H.-Y. Hao
- H.J. Maris
- et al.
- 1998
- Electrochemical and Solid-State Letters