Publications

465 results at IEEE T-ED

IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons
- - Jack Y. C. Sun
  - Matthew R. Wordeman
- 1984
- IEEE T-ED
Evolution of the MOSFET Dynamic RAM—A Personal View
- - Robert H. Dennard
- 1984
- IEEE T-ED
A Schottky-Barrier Diode With Self-Aligned Floating Guard Ring
- - C.T. Chuang
  - Maurizio Arienzo
  - et al.
- 1984
- IEEE T-ED
Threshold and Sheet Concentration Sensitivity of High Electron Mobility Transistors
- - Sandip Tiwari
- 1984
- IEEE T-ED
A Study of Projected Optical Images for Typical IC Mask Patterns Illuminated by Partially Coherent Light
- - Albert C. Liu
  - Burn Jeng Lin
- 1983
- IEEE T-ED
Transconductance Degradation in Thin-Oxide MOSFET's
- - Giorgio Baccarani
  - Matthew R. Wordeman
- 1983
- IEEE T-ED
Silicon-Rich SiO2 and Thermal SiO2 Dual Dielectric for Yield Improvement and High Capacitance
- - Stefan K. C. Lai
  - D.J. Dimaria
  - et al.
- 1983
- IEEE T-ED
Numerical Solution of the Semiconductor Transport Equations with Current Boundary Conditions
- - Bertrand M. Grossman
  - Michael J. Hargrove
- 1983
- IEEE T-ED
On the Current-Voltage Characteristics of n⁺-p-p⁺ Diodes
- - C.T. Chuang
- 1983
- IEEE T-ED
Erasing Characteristics of a Thin-Film Electroluminescent ZnS: Mn Faceplate
- - Omesh Sahni
- 1983
- IEEE T-ED