Method for Determining the Emitter and Base Series Resistances of Bipolar TransistorsTak H. NingDenny D. Tang1984IEEE T-ED
Generalized Scaling Theory and Its Application to a 1/4 micrometer MOSFET DesignRobert H. DennardMatthew R. Wordeman1984IEEE T-ED
Temperature Dependence of FET Properties for Cr-Doped and LEC Semi-Insulating GaAs SubstratesThomas W. Hickmott1984IEEE T-ED
Silicon-Rich SiO2 and Thermal SiO2 Dual Dielectric for Yield Improvement and High CapacitanceStefan K. C. LaiD.J. Dimariaet al.1983IEEE T-ED
Numerical Solution of the Semiconductor Transport Equations with Current Boundary ConditionsBertrand M. GrossmanMichael J. Hargrove1983IEEE T-ED
IVA-7 A New High Purity Si Doping Source for MBE Grown GaAs DevicesP.D. KirchnerJ. Woodallet al.1983IEEE T-ED