Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

Date

Start

End

Featured collections

Popular topics

64 results at IEEE TNS

Comparison of single and two-photon absorption for laser characterization of single-event upsets in SOI SRAMs
- - James R. Schwank
  - Marty R. Shaneyfelt
  - et al.
- 2011
- IEEE TNS
Evaluating the influence of various body-contacting schemes on single event transients in 45-nm SOI CMOS
- - Kurt A. Moen
  - Stanley D. Phillips
  - et al.
- 2010
- IEEE TNS
Characterization of parasitic bipolar transistors in 45 nm silicon-on-insulator technology
- - Larry Wissel
  - Phil Oldiges
  - et al.
- 2010
- IEEE TNS
Alpha-particle emission energy spectra from materials used for solder bumps
- - Michael S. Gordon
  - Kenneth P. Rodbell
  - et al.
- 2010
- IEEE TNS
Impact of spacecraft shielding on direct ionization soft error rates for sub-130 nm technologies
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2010
- IEEE TNS
Heavy ion testing with iron at 1 GeV/amu
- - Jonathan A. Pellish
  - Michael A. Xapsos
  - et al.
- 2010
- IEEE TNS
Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
- - James R. Schwank
  - Marty R. Shaneyfelt
  - et al.
- 2010
- IEEE TNS
Flip-flop upsets from single-event-transients in 65 nm clock circuits
- - Larry Wissel
  - David F. Heidel
  - et al.
- 2009
- IEEE TNS
An evaluation of an ultralow background alpha-particle detector
- - Michael S. Gordon
  - David F. Heidel
  - et al.
- 2009
- IEEE TNS
Modeling of alpha-induced single event upsets for 45 nm node SOI devices using realistic C4 and 3D circuit geometries
- - Henry H. K. Tang
  - Conal E. Murray
  - et al.
- 2009
- IEEE TNS