Nathaniel A. Dodds, James R. Schwank, et al.
IEEE TNS
Paper
An evaluation of an ultralow background alpha-particle detector
Abstract
XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials. © 2009 IEEE.
Related
Michael S. Gordon, Ken Rodbell, et al.
Semiconductor Science and Technology
Larry Wissel, Ethan H. Cannon, et al.
IEEE TNS
James R. Schwank, Marty R. Shaneyfelt, et al.
IEEE TNS