Dependence of Electroluminescence Efficiency and Memory Effect on Mn Concentration in ZnS: Mn ACTEL Devices
- V. Marrello
- Aare Onton
- 1980
- IEEE T-ED
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A Study of the Conversion Efficiency Limit of p+-i-n+ Silicon Solar Cells in Concentrated Sunlight
- Terry I. Chappell
- 1980
- IEEE T-ED
Niobium Oxide-Barrier Tunnel Junction
- Stanley I. Raider
- Robert E. Drake
- et al.
- 1980
- IEEE T-ED
Application of Line-Edge Profile Simulation to Thin-Film Deposition Processes
- Andrew R. Neureuther
- Chiu H. Ting
- et al.
- 1980
- IEEE T-ED
TA-A2 Electrically Alterable Read-only Memory Using Si Rich SiO2 Injectors and a Floating Polycrystalline Silicon Storage Layer
- D.J. DiMaria
- K.M. DeMeyer
- et al.
- 1980
- IEEE T-ED
Simulation of Impurity Freezeout Through Numerical Solution of Poisson's Equation with Application to MOS Device Behavior
- Richard C. Jaeger
- Fritz H. Gaensslen
- 1980
- IEEE T-ED
High-Reliability Pb-Alloy Josephson Junctions for Integrated Circuits
- H.-C. Ward Huang
- Suryadevar Basavaiah
- et al.
- 1980
- IEEE T-ED
Josephson-Logic Devices and Circuits
- Tushar R. Gheewala
- 1980
- IEEE T-ED
Partially Coherent Imaging in Two Dimensions and the Theoretical Limits of Projection Printing in Microfabrication
- Burn Jeng Lin
- 1980
- IEEE T-ED
A Device Model for Buried-Channel CCD's and MOSFET's with Gaussian Impurity Profiles
- Pallab K. Chatterjee
- Geoffrey W. Taylor
- et al.
- 1980
- IEEE T-ED