Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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306 results at IEEE Electron Device Letters

Multifinger embedded T-shaped gate graphene RF transistors with high ratio
- - Shu-Jen Han
  - Satoshi Oida
  - et al.
- 2013
- IEEE Electron Device Letters
Application of VRS methodology for the statistical assessment of BTI in MG/HK CMOS devices
- - Andreas Kerber
  - Eduard Cartier
- 2013
- IEEE Electron Device Letters
Superior PBTI reliability for SOI FinFET technologies and its physical understanding
- - Miaomiao Wang
  - Ramachandran Muralidhar
  - et al.
- 2013
- IEEE Electron Device Letters
Strained SOI FINFET SRAM design
- - Pranita Kerber
  - Rouwaida Kanj
  - et al.
- 2013
- IEEE Electron Device Letters
Tunneling and occupancy probabilities: How do they affect tunnel-FET behavior?
- - Luca De Michielis
  - Livio Lattanzio
  - et al.
- 2013
- IEEE Electron Device Letters
Origins of effective work function roll-off behavior for high-κ last replacement metal gate stacks
- - Takashi Ando
  - Eduard A. Cartier
  - et al.
- 2013
- IEEE Electron Device Letters
Stacking graphene channels in parallel for enhanced performance with the same footprint
- - Aaron D. Franklin
  - Satoshi Oida
  - et al.
- 2013
- IEEE Electron Device Letters
Mechanism for leakage reduction by la incorporation in a HfO ₂SiO₂Si gate stack
- - Kenzo Manabe
  - Koji Watanabe
  - et al.
- 2013
- IEEE Electron Device Letters
GIDL in doped and undoped FinFET devices for low-leakage applications
- - Pranita Kerber
  - Qintao Zhang
  - et al.
- 2013
- IEEE Electron Device Letters
Ultra low contact resistivities for CMOS beyond 10-nm node
- - Zhen Zhang
  - Siyuranga Obasa Koswatta
  - et al.
- 2013
- IEEE Electron Device Letters