Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips

Abstract

Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180nm to 45nm technologies at IBM, and provide some insight into future uses in 32nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future