Eric Kay, Gunther Heim
Journal of Applied Physics
The depth resolution of a nickel-copper interface has been measured as a function of the total depth of analysis using the glow-discharge mass-spectrometric depth-profiling technique. A possible interpretation of the results is that the depth resolution is determined by a 30-Å depth-independent interface broadening plus a broadening which varies between 2 and 8% of the total depth of analysis.
Eric Kay, Gunther Heim
Journal of Applied Physics
U. Gerlach-Meyer, J.W. Coburn, et al.
Surface Science
Eric Kay, R.A. Sigsbee, et al.
Applied Physics Letters
J.W. Coburn, Harold F. Winters
Critical Reviews in Solid State and Materials Sciences