Raphael Robertazzi, Louis Medina, et al.
IEEE ITC 2010
Review
Memories of tomorrow
Abstract
No abstract available.
Related
John Barth, William Reohr, et al.
ISSCC 2007
Conference paper
A 5.6-100K, 128ppm/K Cryo-CMOS Current Reference
Subhajit Ray, David Frank, et al.
VLSI Technology and Circuits 2025
Sudipto Chakraborty, David J. Frank, et al.
IEEE JSSC