Conference paperRadiation-Induced Charge Trapping in Thin Al2O 3/SiOxNy/Si(100) Gate Dielectric Stacks
Conference paperEstimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
PaperNew Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle
