Detection of impurities on silicon surfaces
- D.J. DiMaria
- W. Reuter
- et al.
- 1981
- Journal of Applied Physics
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119 results for D.J. DiMaria
Dual-Electron-Injector-Structure Electrically Alterable Read-Only-Memory Modeling Studies
- D.J. Dimaria
- David W. Dong
- et al.
- 1981
- IEEE T-ED
TA-A2 Electrically Alterable Read-only Memory Using Si Rich SiO2 Injectors and a Floating Polycrystalline Silicon Storage Layer
- D.J. DiMaria
- K.M. DeMeyer
- et al.
- 1980
- IEEE T-ED
MP-B5 Graded or Stepped Insulator MIS Structures (GI-MIS or SI-MIS)
- D.J. DiMaria
- D.W. Dong
- 1979
- IEEE T-ED
The electron trapping behavior of silicon dioxide with ion implanted aluminum
- D.R. Young
- D.J. DiMaria
- et al.
- 1977
- Journal of Electronic Materials
Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids
- D.J. DiMaria
- Z.A. Weinberg
- et al.
- 1977
- Journal of Electronic Materials
Electron injection studies of radiation induced positive charge in MOS devices
- J.M. Aitken
- D.J. DiMaria
- et al.
- 1976
- IEEE TNS
Capture and emission of electrons at 2.4-eV-deep trap level in SiO2 films
- D.J. DiMaria
- F.J. Feigl
- et al.
- 1975
- Physical Review B
Photocurent spectroscopy in thin-film insulators: Voltage dependence of the external-circuit current
- D.J. Dimaria
- F.J. Feigl
- 1974
- Physical Review B