New model of a common origin for trapped holes and anomalous positive charge in MOS capacitors
- Y. Roh
- L.P. Trombetta
- et al.
- 1993
- Microelectronic Engineering
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221 results at Microelectronic Engineering
Reactive ion etching of InAlAs with Ar/Cl2 mixtures for ridge waveguide lasers
- R. Germann
- S. Hausser
- et al.
- 1993
- Microelectronic Engineering
Hot-electron dynamics in SiO2 and the degradation of the Si/SiO2-interface
- E. Cartier
- D.J. DiMaria
- 1993
- Microelectronic Engineering
Arrayed miniature electron beam columns
- T.H.P. Chang
- L.P. Muray
- et al.
- 1993
- Microelectronic Engineering
Carbon impurities at a Si-SiO2 interface
- S.I. Raider
- 1993
- Microelectronic Engineering
Measurement of the effective wavelength of x-ray lithography sources
- Juan R. Maldonado
- Inna Babich
- et al.
- 1993
- Microelectronic Engineering
SiGe-base bipolar transistors for cryogenic BiCMOS applications
- John D. Cressler
- 1992
- Microelectronic Engineering
Definition and measurement rule for voltage resolution of contactless testing systems based on electron-beam or photoemission methods
- R. Clauberg
- R. Lackmann
- 1992
- Microelectronic Engineering
SiCGe ternary alloys - extending Si-based heterostructures
- Subramanian S. Iyer
- K. Eberl
- et al.
- 1992
- Microelectronic Engineering
Positive mode silylation process characterization
- D.C. La Tulipe
- A.T.S. Pomerene
- et al.
- 1992
- Microelectronic Engineering