Publications

465 results at IEEE T-ED

VA-6 Temperature-Dependent Properties of the Double HBJT
- - S. Tiwari
  - S.L. Wright
  - et al.
- 1985
- IEEE T-ED
Two-Dimensional Simulation of MODFET and GaAs Gate Heterojunction FET's
- - Jeffrey Yuh-Fong Tang
- 1985
- IEEE T-ED
A Fully Scaled Submicrometer NMOS Technology Using Direct-Write E-Beam Lithography
- - Matthew R. Wordeman
  - April M. Schweighart
  - et al.
- 1985
- IEEE T-ED
Stability and SER Analysis of Static RAM Cells
- - Barbara Chappell
  - Stanley E. Schustfr
  - et al.
- 1985
- IEEE T-ED
A Self-Aligned 1-μm-Channel CMOS Technology with Retrograde n-Well and Thin Epitaxy
- - Yuan Taur
  - Genda J. Hu
  - et al.
- 1985
- IEEE T-ED
Experimental Study of the Minority-Carrier Transport at the Polysilicon—Monosilicon Interface
- - Arnost Neugroschel
  - Maurizio Arienzo
  - et al.
- 1985
- IEEE T-ED
IIIB-2 Channel Length Characterization of LDD MOSFET's-
- - Jack Y. C. Sun
  - Matthew R. Wordeman
  - et al.
- 1985
- IEEE T-ED
A General Control-Volume Formulation for Modeling Impact Ionization in Semiconductor Transport
- - Steven E. Laux
  - Bertrand M. Grossman
- 1985
- IEEE T-ED
An Analytical One-Dimensional Model for Lightly Doped Drain (LDD) MOSFET Devices
- - Fang-Shi J. Lai
  - Jack Yuan-Chen Sun
- 1985
- IEEE T-ED
Performance Limits of CMOS ULSI
- - James R. Pfiester
  - John D. Shott
  - et al.
- 1985
- IEEE T-ED