Zhen Zhang, F. Pagette, et al.
VLSI-TSA 2010
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
Zhen Zhang, F. Pagette, et al.
VLSI-TSA 2010
Hulling Shang, Marvin H. White, et al.
IEEE International SOI Conference 2002
K.-L. Lee, M.M. Frank, et al.
VLSI Technology 2006
A. Khakifirooz, Kangguo Cheng, et al.
VLSI-TSA 2010